nanotools high density, diamond-like carbon (HDC/DLC) tips are shipped in a specially designed gel box and vacuum sealed in an electrostatic discharge (ESD) protective shielding bag. nanotools HDC/DLC tips are characterized by outstanding resolution capabilities, extreme durability, and chemical stability. HDC/DLC tips can be used as any other AFM tips in all conceivable scanning applications. HDC/DLC tips typically do not suffer from or degrade under high loading forces (in contrast to many other AFM probes). HDC/DLC shows material properties comparable to that of diamond, but also exhibits a certain degree of flexibility: HDC/DLC probes tend to elastically bend under very high loading forces. With long and extremely sharp tips this may lead to imaging artifacts, particularly when scans are performed at high frequencies and low set points, i.e. high loading forces and large scan sizes. Such imaging artifacts may be avoided by reducing the effective force between tip and substrate. For longer tips we generally recommend to reduce the scan speed. Generally, HDC/DLC tips do not tend to contaminate during scanning, since most materials adhere poorly on HDC/DLC. If HDC/DLC tips are used on highly adhesive samples or are deeply immersed into a soft sample, some contaminations might occur. In such cases we recommend to carefully immerse the probe into a proper solvent (e.g. double distilled water, isopropanol or acetone) and blow dry with compressed nitrogen or compressed air. While HDC/DLC itself is not attacked by most solvents, we strongly advise you not to apply plasma cleaning or any physical etching. To pick up and handle individual tips packed conventionally, we recommend the usage of metal tweezers. To pick up and handle individual tips packed upside down, we recommend to use carbon tweezers. Using the recommended tweezers helps to avoid damages on the chip edges and ensures the chip remains free of particles. To load a tip cassette, we recommend to use a stereo microscope.
The option to choose from a large variety of cantilevers combined with the nanofabrication of high density diamond-like carbon SPM probes based on electron beam induced processing offers exceptional flexibility and customisability. This approach enables us to fabricate personalised SPM probes, which truly meet your technical requirements: combine cantilever, tip shape, tip orientation and tip coating according to your individual needs or contact us for any further probe designs. 100% ultrahigh resolution SEM quality check for every tip available. Certified quality management system according to ISO 9001. Cantilever options: Tip options: Tip orientation options: Coating options: Didn't find what you were looking for? Please do not hesitate to contact us for any further tip design and specification. We will create your personal tip of almost any desired geometry and functionality.
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Metrology SuperSharp carbon AFM tips for the inspection of very fine high aspect ratio features - Down to <8 nm tip width at 50 nm depth - Tip apex radius of <2 nm for ultrahigh resolution AFM imaging on HAR features - For automated non-contact imaging at 75 kHz or 320 kHz
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Green Line product information: B20 - hemispherical AFM tip for high precision indentation measurements - Hemispherical tip shape. Reliable nanomechanical investigations and consistent data modelling. - Tip shape radius 20 nm ±5 nm. Fabricated with nm precision. - Force constant available from 0.2 N/m to 40 N/m. Matching a wide range of sample stiffness investigations. - Outstanding HDC/DLC tip hardness. Repeatable and reliable deformation measurements.
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Precisely shaped AFM tips with hydrophobic surface properties for challenging biological applications - Tip sharpness down to 2 nm combined with a soft cantilever for non-destructive high-resolution measurements - Tip length up to 15 µm for extended accessibility to subjacent regions on thick samples - Smooth hydrophobic tip made of diamond-like carbon for low tip-sample interactions and long-lasting tip performance
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