Green Line product information: B20 - hemispherical AFM tip for high precision indentation measurements - Hemispherical tip shape. Reliable nanomechanical investigations and consistent data modelling. - Tip shape radius 20 nm ±5 nm. Fabricated with nm precision. - Force constant available from 0.2 N/m to 40 N/m. Matching a wide range of sample stiffness investigations. - Outstanding HDC/DLC tip hardness. Repeatable and reliable deformation measurements.
The option to choose from a large variety of cantilevers combined with the nanofabrication of high density diamond-like carbon SPM probes based on electron beam induced processing offers exceptional flexibility and customisability. This approach enables us to fabricate personalised SPM probes, which truly meet your technical requirements: combine cantilever, tip shape, tip orientation and tip coating according to your individual needs or contact us for any further probe designs. 100% ultrahigh resolution SEM quality check for every tip available. Certified quality management system according to ISO 9001. Cantilever options: Tip options: Tip orientation options: Coating options: Didn't find what you were looking for? Please do not hesitate to contact us for any further tip design and specification. We will create your personal tip of almost any desired geometry and functionality.
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nanotools QUANTUM-AC10 tips featured in research article Discover how nanotools QUANTUM-AC10 (Soft & Sharp) with 0.1N/m cantilevers and 2-3nm radius are applied to study dynamic structural changes of proteins during functional processes in solution.
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Metrology SuperSharp carbon AFM tips for the inspection of very fine high aspect ratio features - Down to <8 nm tip width at 50 nm depth - Tip apex radius of <2 nm for ultrahigh resolution AFM imaging on HAR features - For automated non-contact imaging at 75 kHz or 320 kHz
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Blue Line product highlight: MSS 4-Star: A durable depth metrology solution for consistent bottom access of finest features Controlled shape: Precisely controlled length of 100 nm and width of 10 nm measured at 50 nm from apex Controlled orientation: 12° or 3° Tilt compensation within ±1° or ±0.5° for enhanced access capabilities to bottom trench features Optimized cantilevers: Standard with with k: 2.8 N/m, f: 75 kHz or k: 40 N/m, f: 320 kHz Other cantilevers available upon request Diamond-like hardness and durability: Unmatched diamond-like carbon wear resistance for consistent performance and reduced cost per measurement Delivered with TrueDimensions™: Datasheet for every single probe available online 24/7 via QR code
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