Part number NT_MSS_v0010 Tip Material HDC/DLC Shape conical Tip length / l 250 nm(±50 nm) Diameter / d (measured at 150 nm)15 nm(±5 nm) Half cone angle / Φ<2°(AR>10) Radius / r<2 nm(≤3 nm) Tilt compensation / θ 13°(±1°) Pyramid height / PH 15 µm(10-15 µm) Tip set back / TSB 15 µm(5-25 µm) Cantilever Material Si Shape NT-FESPA Length / L 225 µm(±25 µm) Width / W 28 µm(± 5µm) Thickness / T 3 µm(±0.5 µm) Force constant / k 2.8 N/m(1-5 N/m) Resonance Frequency / f 75 kHz(50-100 kHz) Coating Tip side none Back side reflex Chip Length / L_Chip 3400 µm Width / W_Chip 1600 µm Thickness / T_Chip 315 µm Alignment grooves yes n/a: specification not applicable for this product Numbers in parentheses: guaranteed range Handling sheet Packaging Set of 5
The option to choose from a large variety of cantilevers combined with the nanofabrication of high density diamond-like carbon SPM probes based on electron beam induced processing offers exceptional flexibility and customisability. This approach enables us to fabricate personalised SPM probes, which truly meet your technical requirements: combine cantilever, tip shape, tip orientation and tip coating according to your individual needs or contact us for any further probe designs. 100% ultrahigh resolution SEM quality check for every tip available. Certified quality management system according to ISO 9001. Cantilever options: Tip options: Tip orientation options: Coating options: Didn't find what you were looking for? Please do not hesitate to contact us for any further tip design and specification. We will create your personal tip of almost any desired geometry and functionality.
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Metrology SuperSharp carbon AFM tips for the inspection of very fine high aspect ratio features - Down to <8 nm tip width at 50 nm depth - Tip apex radius of <2 nm for ultrahigh resolution AFM imaging on HAR features - For automated non-contact imaging at 75 kHz or 320 kHz
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Green Line product information: B20 - hemispherical AFM tip for high precision indentation measurements - Hemispherical tip shape. Reliable nanomechanical investigations and consistent data modelling. - Tip shape radius 20 nm ±5 nm. Fabricated with nm precision. - Force constant available from 0.2 N/m to 40 N/m. Matching a wide range of sample stiffness investigations. - Outstanding HDC/DLC tip hardness. Repeatable and reliable deformation measurements.
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Precisely shaped AFM tips with hydrophobic surface properties for challenging biological applications - Tip sharpness down to 2 nm combined with a soft cantilever for non-destructive high-resolution measurements - Tip length up to 15 µm for extended accessibility to subjacent regions on thick samples - Smooth hydrophobic tip made of diamond-like carbon for low tip-sample interactions and long-lasting tip performance
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