The Sierra SPR®-24/32 Pro employs the Surface Plasmon Resonance imaging detection called SPR+. SPR+ enables the imaging of 2-dimensional arrays with a level of detection sensitivity normally restricted to linear arrays. SPR+ derives its high sensitivity by combining traditional SPR imaging with high intensity laser light and high speed optical scanning. The intensity of the light source permits the use of high-speed cameras, which in turn permit more resonance measurements per scan. The net result is lower RMS noise and improved accuracy when measuring small response changes. For reproducible sample delivery, the Sierra SPR®-24/32 Pro system utilizes proprietary Hydrodynamic Isolation (HI) technology. HI is a method for presenting small, yet highly discrete fluid volumes, to isolated locations on a two-dimensional surface contained within a flow cell under laminar flow. Location-specific fluid addressing within the flow cell is facilitated by combining components of hydrodynamic focusing with site-specific evacuation. The process does not require the use of physical barriers within the flow cell or mechanical valves to control the paths of fluid movement, thereby permitting high-throughput multiplexing or the construction of two-dimensional arrays with individually addressable detection spots.
Bruker’s Hysitron PicoIndenters make it easy to conduct in-situ mechanical experiments in your electron microscope. Our unique transducer design ensures stability throughout the entire experiment, producing precise data even at the nanoscale. Correlating video capture from the microscope with in-situ mechanical testing data enables real-time monitoring to advance nanoscale materials property understanding. Available modes include nanoindentation, compression, tensile, and bend testing, and additional accessories are available to facilitate high- and low-temperature experiments.
CATEGORY
Bruker’s Electron Microscope Analyzers range, including EDS, WDS, EBSD and Micro-XRF on SEM, provides electron microscope users with the tools needed to perform a highly-detailed compositional and structural analysis of their samples. The full integration of these techniques into Bruker’s ESPRIT software means users can easily combine the data obtained by each of these complementary methods.
CATEGORY
With a range of operating voltages between 30 and 200 kV, the Nion ULTRASTEM uses a high-brightness, high-stability cold field emission electron gun (CFEG) that allows higher resolution, higher probe current providing sub-Angstrom resolution imaging, fast nanoanalysis with an atom-sized electron probe, and efficient coupling to a variety of detectors.
CATEGORY
12.6K sub-Å imaging 10 hours cooling time 4 mK sample temperature stability <4 Å/min sample drift Stable, all-day cooling Flexible side entry design Sub-Å imaging at 12.6K Figure 1 (left column) 0.9 Å resolution 200kV STEM HAADF image of Au nanoparticles at a sample temperature of 12.6K. Figure 3 Cooling curves of major cryo-stage components. Capable of long, stable cooling times with a 4 mK temperature stability at the sample. Figure 2 Cryo-stage block diagram with temperature sensor locations for cooling curve data. Sample Rod Radiation Shield LHe Cryostat (1Å) -1 ELECTRON MICROSCOPY Liquid Helium Cryogenic Electron Microscope
CATEGORY
