Together with a leading manufacturer of Scanning Probe Microscopes (SPMs), we have been developing the CN6000 SPM. This is a highly capable yet affordable AFM system which integrates the ability to perform STM (Scanning tunneling microscopy), and AFM (Atomic Force Microscopy) with a wide range of imaging and measurement modes available. The AFM can operate in contact mode, dynamic mode and in air or liquid. There are a wide range of accessories available for the microscope, including different scanners (There are 7 scanners available from1.5 microns for high resolution imaging to 100 microns for large-area imaging). The scanners are easily interchangeable. This is a sample-scanning system so does not fall prey to the instabilities associated with tip-scanning microscopes where the optics do not always scan correctly with the tip. The microscope comes complete with passive vibration isolation, and an optical viewing system can be supplied.
