By Advanced Optical Technologies
If you want accurate and actionable optical metrology at your facility, for instance manufacturing quality-control, a graphics or material-characterization laboratory, or an add-on to an existing system, then AOT may be able to build your instrument utilizing our core advantages. Considering the high-dimensional material and configuration spaces accessible through AOT designs, we recognize that no instrument can measure even a majority of these coordinates, so every instrument is custom to your requirements. AOT will understand your material and configuration spaces and offer the most efficient and affordable custom optical metrology instrument. Your instrument will have access to the benefits of AOT's measurement services, including but not limited to Obtain Comprehensive Specifications Both on your instrument and through its measurements Multi-Scale and Multi-Dimensional Characterization Understand material properties scalable to relevant topologies Low Error and Noise Get the most modern highest-quality solution Data Visibility Get data in raw parsable, common language, and graphical formats From manufacturing quality-control of surface finish to crystallography to polarization optics to non-linear nanocrystals to thin films to diffraction gratings, the applications of AOT custom metrology instruments are open to your creativity.
CrystalView is the only patented laser polarized-light microscope (PLM) developed for quantitative large-area microstructure characterization with an instant field-of-view exceeding 2cm 2. CrystalView is the first and only Quantitative Wide-Field PLM, offering the fastest imaging - 15 minutes including processing - and higher contrast than electron backscatter diffraction (EBSD) without pixel replacement. Microscopy Today recognized CrystalView as a top ten 2024 Innovation Award winner. CrystalView's fundamentally new design significantly outperforms computational add-on PLMs in terms of field-of-view, speed, material diversity, and surface tolerance, and its unique horizontal configuration allows crystallographic imaging of large and in-situ parts. CrystalView consolidates optical and orientation imaging, expanding microstructure visualization and analysis. CrystalView is the only true high-throughput crystallographic microscope for material research and production facilities. Benefits CrystalView is a fast and affordable microscope that allows users to analyze microstructures over larger areas for improved statistics Measure Non-Destructively Visualize crystallographic microstructure without cutting your parts Expand Field-of-View Collect crystallographic orientation images 1" x 1" and larger Simplify Sample Preparation CrystalView works for rotary polished samples and suffers fewer non-indexed pixels than EBSD Reduce Cost Dramatically reduce sample preparation and labor costs Return on Investment (ROI) Time Saved Per Sample: 30 to 45 hrs Savings Per Year: Over $1.5M (For 2000 samples) Productivity Gains: ~300% Applications The CrystalView microscope offers non-destructive, large-area, high speed orientation imaging for grain-boundary & microtexture analysis, process development, quality control, failure analysis, and other applications with non-cubic and cubic metals including titanium, zirconium, nickel, stainless steel, aluminum and most of their alloys. Systems can also be customized for oriented non-metals including ceramics, fiber composites, textiles, and plastics. CrystalView allows visualization of material microstructural properties correlated with failure and corrosion probabilities in high-strength and high-performance parts for additive manufacturing, aerospace, automotive, chemical, defense, energy, architectural, and medical applications. CrystalView works in air and, as a parallel imaging technique, at much higher speeds and fields-of-view than scanning alternatives. True High-Throughput Crystallography CrystalView Process for 2.3cm 2 Image Size Time Saved with CrystalView CrystalView offers the fastest imaging - 15 minutes including processing - over 2.3 cm 2 instant field-of-view, without cutting the part. It can image rotary-polished samples, saving 24 hours or more of polishing time. Alternative COTS PLM add-ons may offer high instrument throughput, but are slow to process images due to curve-fitting. CrystalView employs closed-form mapping rather than curve-fitting, making it the only true high-throughput crystallographic microscope for material research and production facilities. Large-Area Grain Statistics (LAGS) CrystalView Large-Area Grain Statistics (LAGS) provides maximum confidence in crystallographic analysis. The image below demonstrates LAGS of forged Ti64 encompassing over 10,000 grains. The segmentation image was generated, consistent with ASTM E2627, in under 30 minutes on a standard laptop computer.
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CrystalView is the only patented laser polarized-light microscope (PLM) developed for quantitative large-area microstructure characterization with an instant field-of-view exceeding 2cm 2. CrystalView is the first and only Quantitative Wide-Field PLM, offering the fastest imaging - 15 minutes including processing - and higher contrast than electron backscatter diffraction (EBSD) without pixel replacement. Microscopy Today recognized CrystalView as a top ten 2024 Innovation Award winner. CrystalView’s fundamentally new design significantly outperforms computational add-on PLMs in terms of field-of-view, speed, material diversity, and surface tolerance, and its unique horizontal configuration allows crystallographic imaging of large and in-situ parts. CrystalView consolidates optical and orientation imaging, expanding microstructure visualization and analysis. CrystalView is the only true high-throughput crystallographic microscope for material research and production facilities. Benefits - Measure Non-Destructively: Visualize crystallographic microstructure without cutting your parts - Expand Field-of-View: Obtain crystallographic orientation images 1" x 1" and larger - Improve Statistics: Capture low-frequency features - Reduce Cost: Reduce sample preparation and labor costs Applications The CrystalView microscope offers non-destructive, large-area, high speed orientation imaging for grain-boundary & microtexture analysis, process development, quality control, failure analysis, and other applications with non-cubic and cubic metals including titanium, zirconium, nickel, stainless steel, aluminum and most of their alloys. Systems can also be customized for oriented non-metals including ceramics, fiber composites, textiles, and plastics. CrystalView allows visualization of material microstructural properties correlated with failure and corrosion probabilities in high-strength and high-performance parts for additive manufacturing, aerospace, automotive, chemical, defense, energy, architectural, and medical applications. CrystalView works in air and, as a parallel imaging technique, at much higher speeds and fields-of-view than scanning alternatives. Large-Area Grain Statistics (LAGS) CrystalView Large-Area Grain Statistics (LAGS) provides maximum confidence in crystallographic analysis. The image below demonstrates LAGS of forged Ti64 encompassing over 10,000 grains. The segmentation image was generated, consistent with ASTM E2627, in under 30 minutes on a standard laptop computer.
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As our flagship product, AOT's patented field polarimeters are redefining how sensors classify materials in real time. Field polarimeters are available in low-cost compact passive mode, high-specificity robust active mode, or hybrid active-passive mode, all in various bands including eye-safe short-wave infrared (SWIR) and video rate as needed. Field polarimeters can include application-specific classification algorithms and software, installation and training, and long-term technical support. An AOT field polarimeter can boost your imaging and classification performance well beyond conventional imaging sensors. Benefits Highlight Materials of Interest Achieve robust high-speed material mapping and assessment with high sensitivity and specificity Multi-Channel Video Probe and exploit high-dimensional signature spaces at video rates Enable Edge Processing Material-based algorithms work on-board the sensor without cloud or high-performance computing Low Memory and Bandwidth Requirements On-board data formats allow streaming and collection over long durations and large areas Statistics Assess performance with modern machine learning algorithms
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AOT's patented CrystalView Crystallographic Polarization-Classification Imaging (CPCI) provides crystallographic orientation images in air at much higher speeds with less surface polishing and over larger areas than EBSD. CrystalView CPCI has significant advantages for industrial use.
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