By Deben UK Ltd
The Deben ARM2 STEM detector is a retractable SEM detector that enables bright field, dark field, and phase contrast STEM imaging, with flexible signal mixing and high-sensitivity detection for detailed microstructural analysis. The Deben Solid state Gen5 STEM detector is modular, with the motorised ARM2 mechanical interface at the heart of the system. Also included are Gen5 electronics and software GUI, as well as various diode options available for both STEM and BSE imaging. ARM2 can be adapted to most conventional SEMs having a free chamber port at 90° to the beam axis. Control of diode segments and brightness/contrast is from within the software GUI, with up to three simultaneous video channels available (optional). A retractable PN diode semiconductor STEM detector configured with four Dark Field (DF) diodes wired as two pairs and a single Bright Field (BF) diode. The system may be operated in BF mode, DF mode or DF Phase Contrast mode along with mixing between segments, DF+BF for example. Twelve 3mm grids can be fitted to the standard STEM grid holder, allowing multiple specimen analysis. A retractable arm complete with Deben Gen5 electronics allows the STEM Detector to be used with any SEM with a free chamber port and AUX video input. The 12 position grid holder is airlock compatible and supplied complete with stage dovetail/sledge as required. The STEM detector assembly uses a single Bright Field and 4 element Dark Field diode. Such is the performance of this design that it has proved equally successful fitted to both FEG and Tungsten SEMs. The STEM detector assembly inserts below the grid holder and has X,Y, Z position adjustment. Dark field diodes are configured so they can operate in full Dark Field or Dark Field Phase Contrast mode. Deben Gen5 electronics is configured with four input channels and a single video output channel (optional two or three simultaneous video outputs). Four Element Dark Field (DF) and Bright Field (BF) - x2 modes of operation, including DF and BF - Hardware configuration allowing over 9 combinations of signal Triple Annular STEM - Ideal for life sciences and material science applications - x4 modes of operation, including HAADF, MAADF, LAADF and BF - Hardware configuration allowing over 14 combinations of signal Bi-Annular 4 Quadrant STEM - Ideal for material science applications - x5 modes of operation, including HAADF, ADF, DF, BF and Phase Contrast - Hardware configuration allowing over 34 combinations of signal, including bi-directional phase contrast imaging
CT500 X-ray CT Tensile and Compression Stage. X-ray CT Tensile and Compression stage with high strength ULTEM support tube
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Deben Open Frame OF20kN Tensile, Compression, and Torsion testing system
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Microtest™ MT5000EH EBSD Tensile and Compression Stage. Tensile and compression testing stage with precision slides and symmetrical stainless-steel leadscrew
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CT5000RT X-ray CT Tensile and Compression Stage A compact in-situ tensile and compression stage for X-ray CT and µXCT systems, enabling real-time 3D imaging of internal material behaviour during mechanical loading. CT5000RT – In-Situ Tensile & Compression Stage for X-ray CT In association with the major manufacturers µXCT systems including Zeiss, RX Solutions, Bruker, Tescan/XRE, Nikon, Sigray and Baker Hughes/Waygate we are now able to offer an integrated tensile testing solution for your µXCT application. Using tensile testing with µXCT provides a clear visual interpretation of how the properties of materials and composites change under different loading conditions. The compact design of these testing stages allow them to be used with the smallest high resolution micro CT systems providing a range of tensile and compression stages with forces up to 20kN and resolutions down to 25mN. Systems are controlled from the comprehensive MICROTEST tensile stage control software giving a wide range of control functions and a live display of load versus extension and supplied with all required cabling and mounting adaptors for specific µXCT systems. Further details and pricing is available from your micro CT supplier or direct from Deben. Suitable for: Semiconductors Life Sciences Soft Materials Raw Materials X-Ray Computed Tomography (XCT) Synchrotron Metallurgy Ceramics Electronics Features - X-ray CT tensile & compression testing stage - 5kN loadcell with linearity ±1% of full-scale range including loadcell exchange kit - Accuracy ±0.5%, dynamic resolution 1%, static resolution 0.05% of full-scale range - Extensometer for position readout, 300nm resolution - Maximum travel: 10mm, standard gauge length 10mm – 20mm tensile, 15mm – 5mm compression (different gauge lengths available upon request) - User exchangeable gearbox with speed range 1mm/min. to 1.0mm/min. - Simple specimen exchange mechanism with high strength vitreous glassy carbon support tube: 60mm OD, wall thickness 3mm, (6mm in beam path) - Tensile & compression jaws as well as compression plates - Maximum sample size: Compression: 39mm diameter x 50mm high; Tensile: 30mm long including 10mm clamping region at each end x 20mm wide x 5mm thick - Height to match X-ray source - Stage weight: 5kg approx - MICROTEST™ software control
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