Tip radius / r, k 40 N/m, k 2.8 N/m, k 0.2 N/m 20 nm: NT_B20_v0010, NT_B20_v0020, NT_B20_v0030 30 nm: NT_B30_v0010, NT_B30_v0020, NT_B30_v0030 40 nm: NT_B40_v0010, NT_B40_v0020, NT_B40_v0030 50 nm: NT_B50_v0010, NT_B50_v0020, NT_B50_v0030 100 nm: NT_B100_v0010, NT_B100_v0020, NT_B100_v0030 150 nm: NT_B150_v0010, NT_B150_v0020, NT_B150_v0030 300 nm: NT_B300_v0010, NT_B300_v0020, NT_B300_v0030 500 nm: NT_B500_v0010, NT_B500_v0020, NT_B500_v0030 1000 nm: NT_B1000_v0010, NT_B1000_v0020, NT_B1000_v0030 1500 nm: NT_B1500_v0010, NT_B1500_v0020, NT_B1500_v0030 2000 nm: NT_B2000_v0010, NT_B2000_v0020, NT_B2000_v0030 Cantilever parameter NCHAu FMAu CONTAu Material Si Si Si Length / L 125 µm 225 µm 450 µm Width / W 30 µm 28 µm 50 µm Thickness / T 4 µm 3 µm 2 µm Force constant* / k 40 N/m 2.8 N/m 0.2 N/m Resonance frequency* / f 330 kHz 75 kHz 13 kHz Tip side coating none none none Back side coating Au reflex Au reflex Au reflex Chip parameter Length / L_chip 3400 µm 3400 µm 3400 µm Width / W_chip 1600 µm 1600 µm 1600 µm Thickness / T_chip 315 µm 315 µm 315 µm Alignment grooves yes yes yes *Cantilever resonance frequency and force constant individually extracted from Laser Doppler Vibrometer (LDV) measurements. Online access to key probe parameters for every individual tip via TrueDimensions Product Flyer Handling sheet Packaging Set of 5
The option to choose from a large variety of cantilevers combined with the nanofabrication of high density diamond-like carbon SPM probes based on electron beam induced processing offers exceptional flexibility and customisability. This approach enables us to fabricate personalised SPM probes, which truly meet your technical requirements: combine cantilever, tip shape, tip orientation and tip coating according to your individual needs or contact us for any further probe designs. 100% ultrahigh resolution SEM quality check for every tip available. Certified quality management system according to ISO 9001. Cantilever options: Tip options: Tip orientation options: Coating options: Didn't find what you were looking for? Please do not hesitate to contact us for any further tip design and specification. We will create your personal tip of almost any desired geometry and functionality.
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Metrology SuperSharp carbon AFM tips for the inspection of very fine high aspect ratio features - Down to <8 nm tip width at 50 nm depth - Tip apex radius of <2 nm for ultrahigh resolution AFM imaging on HAR features - For automated non-contact imaging at 75 kHz or 320 kHz
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Green Line product information: B20 - hemispherical AFM tip for high precision indentation measurements - Hemispherical tip shape. Reliable nanomechanical investigations and consistent data modelling. - Tip shape radius 20 nm ±5 nm. Fabricated with nm precision. - Force constant available from 0.2 N/m to 40 N/m. Matching a wide range of sample stiffness investigations. - Outstanding HDC/DLC tip hardness. Repeatable and reliable deformation measurements.
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Precisely shaped AFM tips with hydrophobic surface properties for challenging biological applications - Tip sharpness down to 2 nm combined with a soft cantilever for non-destructive high-resolution measurements - Tip length up to 15 µm for extended accessibility to subjacent regions on thick samples - Smooth hydrophobic tip made of diamond-like carbon for low tip-sample interactions and long-lasting tip performance
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