We offer a wide variety of scanning force microscopy probe tips for imaging, metrology, and material characterization, to name only a few. Beside our standard products, we develop and manufacture customer specific cantilevers and probe tips.
Aspire™ AFM probes are conically-shaped AFM tips for general purpose usage. Made of high quality single crystal silicon, the Aspire probes are robust and offer long imaging life. Probe geometry plays an important role when imaging surfaces. Uniform tip shapes guarantee the acquisition of symmetrical images.
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For quantitave 3D AFM the precise tip shape of the AFM - probe needs to be known. For the characterization of probe tips we offer a variaty of probe tip characterizers. A typicall application example is scanning an I²FSR with a CDR - probe to determine the shape of the probe.
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SPM probe tips are for general use in most AFM systems. Team Nanotec offers a wide variety of probes.
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