By Oxford Materials Characterisation Service
Thermo Scientific K-Alpha XPS - Equipped with a 180° double focusing hemispherical analyser-128-channel detector - Microfocused monochromated Al X-ray source - Surface specific analysis (typically between 2 and 8 monolayers) - Quantitative elemental analysis from Li – U, ca. 0.1 at% - Chemical bonding information - Analysis area 30 – 400 μm - Combined low-energy / ion flood source for charge neutralisation - EX06 argon ion source for depth profiling - Multi sample stage (maximum sample size of 55 x 55 mm2 and maximum sample height of 20 mm)
