The Ntegra II is a highly modular scanning probe microscope (SPM) that boasts many imaging and point measurement modes. It is a great tool for anything from topography measurements to custom-environment, tailored experiments. Housed in a temperature and vibration stabilized enclosure, the microscope can easily produce sub-nanometer precision. Ntegra II Features: - Maximum scan area of 100um x 100um x 10um (X Y Z) - Signal breakout box (output/input any electrical signal created/used by the microscope) - Heating/cooling stage -30C to +120C - Sealed liquid cell (image in aqueous environment) - Scanning probe (large samples or liquid environment) Ntegra II Analysis Modes: - Sample topography imaging - Tapping Semi-Contact Atomic Force Microscopy - Tapping Non-Contact Atomic Force Microscopy - Contact Atomic Force Microscopy - Mechanical property imaging - HybriD Mode (mechanical property imaging) - Force-Distance Curves - Lateral Force Microscopy - Phase Contrast Microscopy - Magnetic Force Microscopy - Electrostatic Force Microscopy - Kelvin Probe Microscopy (Scanning Kelvin Microscopy) - Scanning Capacitance Microscopy - Piezoresponse Microscopy Location Roberts Hall Function Scanning Probe Microscopy Rates and materials - Rate type: Hourly - CMU (Internal): $35
