NW
Surface & Interface AnalysisCharacterization & Testing

X-ray Photoelectron Spectrometer Microprobe (XPS) and multi-technique surface analysis instrument

By Jan Koum Center for Nanoscience and Nanotechnology, Tel Aviv University

Manufacturer and model: ESCALAB QXi X-ray Photoelectron Spectrometer Microprobe. Multi-technique surface analysis instrument with high-resolution X-ray photoelectron spectroscopy and imaging,widely used for elemental analysis and chemical analysis of materials. In addition to XPS, this multi-technique combines methods for electronic structure determination (UPS, REELS), surface coverage (ISS), and also Auger electron spectroscopy (AES).To assist all methods is a mono-Ar and cluster-Ar ion source for depth profiles analysis and in-situ sample cleaning.