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Instrument AccessInfrastructure & Training

Near Ambient Pressure Electron Microscope NAP-LEEM-XPEEM

By Helmholtz-Zentrum Berlin

Many novel infrastructures allow for a wide range of spectroscopic methods under ambient conditions. However, the important aspect of site heterogeneity, catalytically active impurities or defects across the surface is often missing in integral approaches. A near ambient pressure NAP-LEEM/XPEEM instrument would round off the operando instrument portfolio at BESSY II. As part of the CatLab activities, the MPG has purchased a NAP-LEEM/XPEEM instrument, which combines electron microscopy with a lateral resolution between 8 and 30 nm with photoemission spectroscopy (< 60 meV energy resolution) as an operando tool, focusing on surface reactions in the mbar range at temperatures up to 800°C. Uniqueness: Combining this instrument with a tunable soft X-ray source would create a worldwide unparalleled instrument. Accommodating it next to SMART and SPEEM would create a complementary spectromicroscopy analysis section for magnetism (SPEEM), high resolution studies of chemically relevant surfaces (SMART) and operando NAP reactions. Partners: HZB, FHI