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Instrument AccessInfrastructure & Training

Scanning Electron Microscope (JEOL SM-6010PLUS/LA)

By Ohio University

MODEL # OF EQUIPMENT: JEOL SM-6010PLUS/LA BRIEF DESCRIPTION OF EQUIPMENT: The Russ College provides the JEOL JSM-6010PLUS/LA, which is available for use by interested researchers at Ohio University for characterization of metallic, ceramic, polymeric and composite materials. This instrument includes a microscope for geometric and morphological characterization of conductive and non-conductive samples as well as a spectroscope for elemental analyses and distribution. This instrument is complemented by the Denton Vacuum Desk V for pre-treatment of non-conductive samples prior to characterization. CAPABILITIES OF THE EQUIPMENT: - Micro and nano-scale characterization of geometric and chemical distribution in sample - Qualitative elemental analyses for atoms larger than lithium via point, linear or areal mapping. Quantitative elemental analyses for atoms larger than oxygen. - Low vacuum mode for characterization of non-conducting samples without pre-treatment - SEM and EDS conducted within the same software, with the ability to switch from morphological to elemental characterization in seconds. - Export results in a variety of formats including.jpeg,.docx and.pptx for handling ease. TRAINING/TECHNICAL HELP AVAILABLE OR REQUIRED TO USE EQUIPMENT? Yes FEES FOR USE OF EQUIPMENT? Yes, $55 CONTACT: Joy Malaba malaba@ohio.edu LOCATION: RROC 111 Ohio University Athens, OH 45701