By Jan Koum Center for Nanoscience and Nanotechnology, Tel Aviv University
Manufacturer and model: Zeiss GeminiSEM 300 – High Resolution Scanning Electron Microscope (HRSEM) Description: SEM analysis with the Zeiss GeminiSEM 300 provides high-resolution imaging using a field emission scanning electron microscope with sub-nanometer resolution. The system is equipped with a variety of detectors for the efficient detection of different signals emerging from the sample. It features: Versatile detector suite: - Everhart-Thornley & solid-state detectors for secondary electron - Angular- and energy-resolved backscattered electron detection - Transmitted electron imaging with angular resolution for ultra-thin samples Gemini column design: stunning resolution even at low beam energies Ideal for advanced materials science, nanotechnology, semiconductors, life sciences, and more.
