By The Center for Nanoscale Materials
Understanding the microscopic structure of materials is essential for determining their properties and for the creation of new, useful devices. For decades, electron and X-ray microscopies have been used to look inside matter. Electron microscopes can now resolve single atoms buried within structures, while X-ray microscopes can discern minute lattice distortions in materials. Center for Nanoscale Materials (CNM) researchers with deep expertise in these two areas work closely together to create the most powerful images of material structures and dynamics. Combining our emerging ultrafast microscopy capabilities with our newly developed capabilities of aberration-corrected atomic-resolution dynamic STEM imaging and CL spectroscopy, X-ray fluorescence spectroscopy, in-situ liquid/gas/heating/cooling, hundredths-of-picometer strain sensitivity in two and three dimensions, and artificial intelligence enabled image reconstructions – our goals are to characterize, and ultimately to control, the functionalities of materials from the atomic scale to the device level. Key capabilities: - Hard X-ray Nanoprobe, located at APS Sector 26 - Ultrafast Electron Microscopy (UEM) - TFS Spectra 200 STEM - TEM/STEM: FEI Talos S/TEM - JEOLJEM-2100F Field-Emission-Gun Transmission Electron Microscope - FEI Quanta 400F ESEM - Hitachi S-4700-II SEM - JEOL IT800HL SEM
