Nanoscale thermal analysis and conductivity mapping with AFM Advanced Thermal Characterization at the Nanoscale Thermal measurements AFM combines atomic force microscopy with thermal analysis capabilities, enabling precise measurement of thermal properties at the nanometer scale. Our systems offer two primary modes: thermal analysis for phase transition measurements and Scanning Thermal Microscopy (SThM) for thermal conductivity mapping. Key Features SThM - <50 nm Thermal Spatial Resolution: Up to 20 nm precision for detailed thermal mapping - 0.01°C Sensitivity: Exceptional temperature detection accuracy - Temperature Measurements up to 400°C: Wide operational temperature range - Thermal Conductivity Mapping: Comprehensive thermal property visualization Principle of Operation The probe mounted on a dedicated support is moved to the point selected and placed on the surface of the sample. Then the temperature of the tip is ramped linearly with time while the degree of bending is monitored. At the point of phase transition, the material beneath the tip softens and the probe penetrates into the sample, this provides the nanoscale equivalent of a bulk thermo-mechanical analysis experiment whereby you can measure the phase transition temperatures of the sample such as Tg or Tm. Specifications: - Spatial Resolution: <50 nm (up to 20 nm achievable) - Temperature Sensitivity: 0.01°C - Operating Temperature Range: Up to 700°C - Measurement Types: Thermal conductivity, temperature mapping, Tg/Tm analysis - Sample Compatibility: Various materials including polymers, composites, and advanced materials Application fields Materials Science Polymers Semiconductors 2D Materials Biology Energy Materials
