By NenoVision
A unique AFM-in-SEM solution with LiteScope for in-situ correlative analysis of cathodes, enabling comprehensive electrical and chemical characterization of active material properties and their changes caused by battery cycling. The LiteScope workflow allows for an air-free sample transfer system that prevents contamination by oxygen and humidity. Focus on the characterization of performance, understanding cycling effects, active material degradation, inter/intraparticle connectivity, and delamination. The AFM-in-SEM solution provides a complete hardware and measurement workflow approach. It allows for an air-free sample transfer system that prevents contamination by oxygen and humidity while ensuring uncompromised sample surface preparation. Key Added Values: - Complementary to SEM analytical capabilities: Techniques like FIB and EDX, integrated with AFM-in-SEM LiteScope, for detailed analysis of battery materials. - No air or humidity exposure of sensitive materials: All in-situ analyses are performed in the protective vacuum environment of SEM, preserving all battery material surfaces from oxidation, changes, or contamination. - Site-specific local resistivity of individual particles: Characterization of local electrical properties, including conductivity and resistivity, in cathode active materials (CAM) and other cathode components. - In-situ performance and degradation analyses within your SEM: Analysis of battery formation and cycling effects on cathode materials, focusing on changes, degradation, and their impact on overall performance and lifespan. Application areas: - Cell and battery components - Raw active materials - Cathodes - Anodes - Solid electrolytes - Liquid electrolytes Measurement workflow: LiteScope ensures samples are not exposed to air during transfer and examination, utilizing a Sample Transfer System to preserve the integrity of battery materials. Battery materials, whether cathodes, solid-state electrolytes, or other components, are usually composed of particles of various sizes. To prepare samples suitable for AFM and SEM analysis, we use ion beam milling to create cross-sections of the specimens. The milling can be performed either ex-situ, outside the SEM in a dedicated Broad Ion Beam device, or in-situ, inside a dual-beam FIB-SEM microscope using a Focused Ion Beam. Since the battery samples are typically air-sensitive, the transfer between the Glovebox, Broad Ion Beam device, and SEM is conducted using a Sample Transfer Module. 1. Ex-situ sample preparation using Sample Transfer System This option allows larger cross-section preparation in specialized instruments while maintaining the sample surface in the necessary environment, even during transfer 2. In-situ sample preparation using Focused Ion Beam LiteScope enables safe AFM probe positioning for large stage tilts, preserving the tip from redeposition and allowing the use of FIB to cut a trench anywhere on the sample. This allows measurement of the uncovered surface using AFM-in-SEM technology. Key Benefits and Features: - Complete measurement workflow: A comprehensive procedure for the cross-sectional analysis of complex battery components and materials testing. - Upgrade to SEM solution: Extended possibilities are enabled using FIB/GIS prep, AFM, C-AFM, KPFM, phase imaging, SE, BSE, EDX, Fz spectroscopy, etc. - Fast and easy sample transfer: The short evacuation time allows for quick and efficient sample exchanges. This minimizes downtime and ensures that samples are handled in a controlled environment, preserving their integrity and preventing contamination. - No air or humidity exposure: Air-sensitive samples are protected from surface contamination or oxidation in a vacuum or inert gas atmosphere at all times.
