By J.A. Woollam
3-Day CompleteEASE Course $1000 - Standard Price $750 - University Price Tuition Credit WHERE: Sharaton Dallas Hotel Room TBA 400 Olive St Dallas, TX 75201 WHEN: May 4-6, 2027 Tuesday-Thursday TIME: (SHORT COURSE) Sign-in: 8:30am (Tuesday) Tuesday Session: 9am-5pm Wednesday Session: 9am-5pm Thursday Session: 9am-noon DEADLINE: Registration ends April 23, 2026. Limited space available. Short course registration fee includes ALL of the following: - SVC Full Conference Registration (includes technical talks) - (1) SVC On-Location Tutorial Credit - Discounted Hotel Rate INTRO TO ELLIPSOMETRY MONDAY – AFTERNOON Requires use of (1) SVC On-Location Tutorial Credit M-102 Introduction to Ellipsometry (half day) - Principles of ellipsometry - Optical constants and light-matter interaction - Using Ellipsometry to measure material properties - Film thickness - Complex refractive index - Survey of applications: - What can Ellipsometry measure? - Ex-situ, in-situ, and in-line examples. - Transparent layers - Cauchy Dispersion - Thickness PreFit - Global Fit - Roughness - Index Grading - Parameterize Layer - Absorbing Films - Semi-Absorbing Films - Wavelength Expansion Fits - B-Spline - Convert to Transparent B-Spline - Gen-Osc - Oscillator Model Theory - Fitting SE + Transmission - Thin Absorbing Materials - Multiple-Layer Analysis IN-SITU SESSION THURSDAY – AFTERNOON Requires use of (1) SVC On-Location Tutorial Credit M-103 In Situ Spectroscopic Ellipsometry (half day) - Spectroscopic Ellipsometry Introduction - In Situ Spectroscopic Ellipsometry Hardware Integration - Common Chamber Integration Considerations and Calibration - In Situ Data Acquisition Modes - Remote Communication with Ellipsometer Software for Control and Feedback - Dynamic Data Analysis Examples
