Scanning Electron Microscopy provides high‑resolution imaging to reveal surface topography and defects at the nanoscale. Accompanying Energy-Dispersive X-ray Spectroscopy provides elemental analysis to explore material composition at the microscale. This technique allows us to characterize morphology, identify contaminants or inclusions, map elemental distribution, and support failure investigations across metals, polymers, coatings, and complex assemblies. By combining detailed imaging with precise chemical data, SEM/EDS delivers the clarity needed to understand how structure and composition influence performance.
