Particle Impact Noise Detection (P.I.N.D.) is a reliability screening technique that employs vibration, shock, and acoustics to detect potentially detrimental loose particles that have the potential of causing short circuits within electronic components and serious malfunctions in system operations. As a requirement for MIL-STD883E, MIL-STD750, and MIL-STD39016, this test has helped the manufacturers of hermetically sealed electronic components greatly increase product reliability over the past thirty years by detecting contaminants within the cavity. Recent advancements in packaging methods have created significantly larger, heavier packages, requiring improvements to test equipment. These include advancements to the closed loop control of vibration, increased dynamic range of closed-loop shock control, and the addition of multiple crystal acoustic sensors. Our non-destructive, high frequency acoustic test detects loose particles moving inside high-reliability, internal cavity electronic components such as relays, transistors, hybrids, integrated circuits, and switches. A shaker is used to excite loose particles within the component cavity. Upon striking the lid of the cavity, some of the particle energy is converted to a wide-band pressure wave that travels through the lid to be detected by the sensitive ultrasonic sensor to which the device under test is attached. To keep the particle moving, a very accurate shock is employed, generated internal to the shaker and feedback-controlled by electronics monitoring the motion of the sensor. See the standard documentation for more information on test requirements, conditions, and procedures related to your application.
