By The Center for Nanoscale Materials
JEOL JEM-2100F Field-emission Transmission Electron Microscope. This instrument provides high-resolution imaging of nanoscale structures in bright- and dark-field modes. The point and line resolutions of the microscope are 0.23 nm and 0.1 nm, respectively. The range of the selected area camera lengths allows the user to obtain electron diffraction patterns that can give information about the ordering in thin films and structures assembled from atoms and nanosized particles. An energy-dispersive X-ray spectrometer allows simple and integrated acquisition of the composition of local regions of the sample. The microscope is capable of automated three-dimensional structural analysis. A Gatan Imaging Filter (GIF) System expands the capabilities to energy-filtered TEM and to electron energy-loss spectroscopy (EELS). The GIF system also enables chemical mapping and bonding state information acquisition. Scientific Contact: Yuzi Liu
