By Jan Koum Center for Nanoscience and Nanotechnology, Tel Aviv University
Every day, multipurpose, scanning and transmission electron microscope ((S)TEM), equipped with a Schottky-type S-FEG (standard-shape field emission gun) that produces a high-stability electron beam. TEM contrast images and electron diffraction patterns are recordable by a Ceta-M camera that may yield 3 frames per second at an outstanding resolution of 4096px x 4096px. STEM bright and dark field micrographs are recordable by a segmented PANTHER detector (4 BF x 4 DF segments) that offers the option for contrast enhancement by DPC and iDPC techniques (differential phase contrast and integrated DPC). STEM HAADF (high angle annular dark field) micrographs, for atomic Z-contrast imaging, are recordable by a Fischione detector. Manufacturer and model: Thermo Fisher Scientific, Talos F200i S/TEM
