Operating in single-pass configuration with a Pt-coated conductive tip, the Nano-Observer’s HD-KFM (High-Definition Kelvin Force Microscopy) revealed nanoscale variations in surface potential. The contact potential difference (CPD) maps showed: - Strong electrical contrast between MoS₂ nanopaths and SiO₂ substrate - ~200 mV potential difference, corresponding to MoS₂ work function of 5.25 eV - Spatial resolution in the tens of nanometers, limited only by tip radius and modulation voltage - Histogram analysis clearly distinguishing the two material systems
