By CIC nanoGUNE
Characterization of materials structure down to the atomic level, nanoscale phase analysis, lattice strain mapping, selected area or convergent beam electron diffraction. Possibility to: - High-resolution TEM/STEM imaging of crystalline or amorphous materials, atomic structure of 2D materials, structure of interfaces and grain boundaries, defects, nanoparticles. - Phase identification in inorganic and organic materials: material stress (i.e. SiC, Si), insulator-to-metal transitions (i.e. VO2), polymer crystallinity, mapping of minerals, organic crystals, etc. Interesting for: Materials science, microelectronics and semiconductors, automotive, laboratory test facilities, microscopy laboratories, machine-tool manufacturers, iron and steel industry, energy storage and solar-energy materials industry, objects of cultural heritage examination, polymer industry, geology, energy and petrochemical companies. Tools: X-ray reflectivity and diffractometry (XRR-XRD); High-resolution Transmission Electron Microscope (HRTEM); Near-field microscope, s-SNOM (NeaSpec)
