The MCF includes a complete facility for transmission and surface specimen preparation. Supporting the specimen preparation for transmission electron microscopy are three Gatan Precision Ion Polishing machines, four dimpling machines, and an electro-polishing system. Surface preparation for scanning electron microscopy specimens includes high vacuum sputter coating and ion etching equipment. For advanced sample preparation, the The NovaLab 600 Dual Beam, Focused Ion Beam and Field Emission Scanning Electron Microscope, is available.