Rapid assessment of ferroelectric device characteristics is critical to improving ferroelectric materials processing as well as developing accurate ferroelectric device models. The combination of Radiant ferroelectric test solutions and Lake Shore probe stations offers researchers a flexible platform to efficiently characterize multiple devices in a cryogenic probing environment. The addition of cryogenic temperature characterization can open new frontiers to understanding dielectric properties, switching mechanisms, and fatigue in ferroelectric materials. Measurements include: Hysteresis vs. temperature, Leakage vs. temperature, Hysteresis speed vs. temperature, Remanent hysteresis vs. temperature, PUND remanent polarization vs. temperature, PUND frequency response vs. temperature, Breakdown voltage vs. temperature, IV vs. temperature, CV vs. temperature, Fatigue vs. temperature, Retention vs. temperature, Imprint vs. temperature. Lake Shore cryogenic chamber and Radiant's test system easily interface. Contact Lake Shore so we can configure the right probe station and precision test platform for your application—supplied jointly by Lake Shore and Radiant.
