Analyze transparent films, layers and coatings for thickness or heights. Analyze Transparent Materials. Our metrology systems enable precise measurement of transparent films and coatings or multilayer films without damaging the material or the need to prepare the sample. Height. Measure height and height differences either on the top of the transparent layer or on the surface beneath it. Simply choose the surface (peak in the sensor settings) you want to measure within the software. Thickness. Measure thickness measurement of transparent materials like coatings down to 2 microns. Or even as thin as 10 nanometers using our reflectometer for thin film analysis. With just a few clicks, you can easily analyze thickness and or perform a feature detection to identify contours and more. Volume. Measure the volume as a net result from fills (positive) or cuts (negative) to achieve a comprehensive understanding of material distribution. Area. Easily analyze areas covered with coatings using adjustable filter lists. These easy to create filters can automatically identify regions based on either height or intensity data of the product materials. Non-Contact Measurement. We offer a wide range of sensor technologies designed to meet your unique requirements, including the option for multi-sensor configurations within a single system. For transparent measurements, chromatic confocal technology is often the most versatile and effective solution.
