By Advanced Technologies Center
Program of training course on SPM FemtoScan operation 1. Introduction a. Principal scheme of SPM (Positioning system; Probe and the system for determination of its state; Feedback system) b. Surface scanning (With feedback; Without feedback) c. General measurement technique (Preparation of the sample and the microscope; Surface measurements and parameters adjusting; Processing and interpretation of the data) 2. Terminology (Cantilever; Probe; Holder; Head; Stage) 3. Scanning Probe Microscope FemtoScan (The general form; Mechanical part; The electronic unit; Scanning heads: Atomic force microscope, Scanning tunneling microscope) 4. Schematic diagrams of the microscope operating in different modes (Atomic Force Microscopy; Scanning Resistive Microscopy; Tapping Mode Atomic Force Microscopy; Tunneling Microscopy) 5. Measurements in the scanning tunneling microscopy mode (Preparation of the sample, providing ohmic contact with the sample; Installing the sample on the scanning stage; Preparation of the needle; Installation of the needle to the tunneling head; Connecting the head to the mechanical part; Installation of the head above the sample; A preliminary approach of the needle to the surface; Screening of the microscope from external noise; The initial set of control parameters; Approaching the surface; The choice of operating point; Surface scanning; Measuring of the tunneling current dependence on the distance; Measuring of the current-voltage characteristics of the tunneling contact; Processing of the experimental data. Differential current-voltage characteristics of the tunneling contact.) 6. Measurements in atomic force microscopy mode (Preparation of the sample; Cantilever installation in the holder; Holder installation in the AFM head; Tuning of the laser; Installation of the sample on the scanning stage; Installation of head above the sample; The initial set of control parameters; Surface approaching; Measuring of the force-distance curve; The choice of operating point; Scanning of the surface; Mode for measuring of the lateral force; Determination of the elastic properties of the surface; Image processing) 7. Measurements in scanning resistance microscopy mode (Preparation of the sample, providing ohmic contact with the sample; Installation of the cantilever into the holder, providing the contact with the probe; Resistance cable connecting; Holder installation in the head; Tuning of the laser; Installation of the sample on the scanning stage; Installation of head above the sample; Checking the conduction signal; Additional screening of the microscope against external noise; The initial set of control parameters; Pre-positioning of the scanner; Surface approaching; Measuring of the force-distance curve; Measuring of the electrical current-distance curve; The choice of operating point; Scanning of the surface; Image processing; The calculation of contact resistance and the local conductivity of the surface) 8. Measurements in tapping mode of atomic force microscope (Preparation of the sample; Installation of cantilever in the holder; Connecting the excitation voltage cable; Installation of the holder in the head; Tuning of the laser; Installation of the sample on the scanning stage; Installation of head above the sample; The initial set of control parameters; Tuning in to the cantilever resonance; Surface approaching; Measuring of the oscillation amplitude - distance curve; The choice of operating point; Scanning of the surface; Phase image; Image processing) 9. Basic knowledge of software (Client program FemtoScan Online; Program Fmboard to manage the server of the microscope; Connecting to a microscope; The toolbar for the control of the microscope; The scan window (the main window); The main modes of the microscope operation; Run scans; Basic operations with images: color scales, averaging over the rows, surface leveling, usage of different filters, Fourier spectrum of an image, three-dimensional representation of the surface, construction of cross sections and the measurement of objects heights, function of the finding of objects)
