By The Center for Nanoscale Materials
The JEOL IT800HL SEM provides high resolution imaging of a variety of samples. The SEM is equipped with several detectors and analytical tools, including secondary and backscatter electron detectors, energy dispersive spectroscopy, scanning transmission detection, low vacuum mode, and electron backscatter diffraction system. Gentle beam mode allows for improved resolution with insulating or beam-sensitive samples. Scientific Contact: Rachel Koritala
