By Wintech Nano-Technology Services Pte. Ltd.
These techniques are instrumental in identifying and localizing faults in semiconductor devices. EMMI detects light emission caused by hotspots or leakage currents in failing devices, while OBIRCH identifies local changes in resistance caused by focused laser stimulation. These methods are particularly valuable for non-destructive fault localization, allowing Wintech Nano to provide deep insights into device failures without compromising the sample.
