By The Center for Nanoscale Materials
The joint CNM/APS Hard X-ray Nanoprobe (HXN) facility at APS beamline 26-ID delivers a hard X-ray beam tunable over the 6–12 keV spectral range and focused to 25 nm onto the sample. This X-ray energy range is ideal for probing crystalline thin films, devices and interfaces, many inner-shell electronic resonances, and mapping most elements in the periodic table. The HXN uses interferometric control to maintain relative positional drift of the focusing optics and sample less than 10 nm/h. The working distance between the X-ray focusing optics and the sample is typically a few mm, enabling a variety of in-situ and operando experiments with variable temperature, applied electric and magnetic fields, and liquid and gaseous environments. A heating/cooling specimen stage supports variable temperature experiments with the HXN over a temperature range of 100–525 K with a step-size of 0.01K and stability of 0.005K. The HXN supports scanning nanodiffraction, Bragg ptychography (5 nm resolution), and multimodal chemical and structural nanoimaging (approximately 30-nm resolution). Scientific Contact: Tao Zhou
