By The Center for Nanoscale Materials
Capabilities include Electrical characterization (associated high-sensitivity test systems, Keithley 4200-SCS/F Semiconductor Parameter Analyzer); Atomic Force Microscopes (ambient); Thermal analysis; Magnetometry; Physical vapor deposition, common loadlock is shared; Tube furnaces; UV-Vis-NIR Spectrometers; Ultrahigh Vacuum Scanning Probe Microscopes (STM/AFM); X-ray diffractometers; and additional synthesis and spectroscopy instrumentation.
