NW
Failure Analysis & DiagnosticsCharacterization & Testing

Die extraction

By Wintech Nano-Technology Services Pte. Ltd.

Project Definition: Open the package by chemical etching or other ways, take out the chip and put it in the sample box. Application advantages: samples with AI Pad can be retained using special treatment; chip can be removed to do front/back side FA. unlimited front and flip package chip, can remove Si silicon covering III-V optoelectronic chip.