By Dectris Ltd.
In order to see the internal structure of materials, objects, devices, and biological samples, a selection of techniques can be used. These include simple phase-contrast imaging, 3D tomography, and scanning techniques, based on scattering or diffraction signals; and coherent, diffraction-based imaging. Although these techniques feature different experimental setups and data-processing algorithms, many of them have the same basic requirements when it comes to an X-ray detector: a small pixel size, a sharp response, and high efficiency for low and high X-ray energies. Below, discover the PILATUS3 and EIGER2 detector families and their uses in diffraction and scattering tomography, XRF-CT, ptychography, grating-based X-ray interferometry, spectral imaging, and high-resolution micro- and nano-computed tomography.
