Unveiling Nanoscale Magnetic Structures Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of magnetic force gradients at the nanoscale. This mode is crucial for studying magnetic materials, data storage devices, and a wide range of magnetic phenomena. Key Features MFM Mode - High Sensitivity: Detect even the weakest magnetic domains and structures - Excellent Spatial Resolution: Achieve lateral resolution down to 20 nm - Non-Destructive Imaging: Ideal for studying sensitive magnetic samples - Quantitative Measurements: Map relative strengths of magnetic fields across surfaces - Integration with Other Modes: Combine MFM with electrical or mechanical property mapping Benefits of MFM Mode - Superior Resolution: Our advanced MFM implementation offers unparalleled spatial resolution and sensitivity. - User-Friendly Interface: Intuitive software makes MFM accessible to both experts and beginners. - Versatility: Easily combine MFM with other AFM modes for comprehensive sample characterization. - Cutting-Edge Research: Stay at the forefront of magnetic nanoscale characterization with our continuously updated technology. How does MFM work? MFM operates as a two-pass scanning technique: 1. Topography Scan: A magnetically coated tip first scans the surface to record topography in tapping mode. 2. Lift Mode: The tip is then raised to a specific height above the sample (typically 20-100 nm). 3. Magnetic Force Detection: As the tip follows the topography at this constant height, it detects long-range magnetic forces. 4. Data Recording: The system records the phase shifts of the cantilever oscillation, which correspond to the magnetic force gradient. This two-pass technique allows for separate optimization of topographical and magnetic measurements, ensuring high-quality data for both. Specifications - Lift Height Range: 10 nm – 200 nm - Lateral Resolution: < 20 nm (tip-dependent) - Compatible with all CSInstruments AFM systems - Optional: Variable magnetic field module for in-situ studies Application Fields Data Storage - Characterization of magnetic recording media - Analysis of bit patterns in hard drives - Development of next-generation magnetic storage technologies Semiconductor Industry - Inspection of magnetic sensors and MEMS devices - Failure analysis in magnetic components Materials Science - Study of magnetic domain structures in various materials - Investigation of magnetic thin films and multilayers - Characterization of novel magnetic nanomaterials Spintronics - Research on spin-dependent transport phenomena - Development of spintronic devices Geoscience - Analysis of magnetic properties in geological samples - Study of magnetic inclusions in minerals How are electrostatic artefacts removed from MFM images? With EFC (electric field cancelling): the electrostatic tip–sample interaction is cancelled during the MFM pass, so the image shows only the magnetic contrast. Can magnetic domains be imaged while a magnetic field is applied? Yes. The Variable Magnetic Field Module applies an in-plane or out-of-plane field (up to 3000 G in plane) during MFM imaging, without current-induced heating of the sample, so domain switching can be followed in situ.
