By Swiss Nanoscience Institute
Characterization of the atomic structure. In Transmission Electron Microscopy (TEM) only thin and electron-transparent samples can be analyzed. This provides insights into the interior of an object. The expertise of the NI lab is to prepare such ultra-thin samples (lamellae) using Focused Ion Beam (FIB) so that these structures can be imaged with TEM or STEM. Scanning Transmission Electron Microscopy (STEM) allows enhanced contrast imaging and enables efficient EDX spectra and elemental mapping at a better resolution compared to SEM.
