By SEC Co.,Ltd
Overview of SEM analysis: Device SE(Secondary Electron) Electron having energy less than 50eV generated in the specimen by inelastic collision of electronic beam and the specimen when incident electron beam collided with the specimen BSE(Backscattered Electron) Electron emitted backwards when incident electron beam collided with the specimen Observation by SEM - Observation of surface image - Observation of cross-section structure - Thickness measurement
