Correlative MFM and SEM Imaging of Magnetic Nanowires

This application note describes the use of an in-situ Atomic Force Microscope (AFM) integrated within a Scanning Electron Microscope (SEM), a product known as AFSEM. The document demonstrates how this setup can perform Magnetic Force Microscopy (MFM) to map the magnetic domains of cobalt nanowires while simultaneously imaging the same area with the SEM for high-resolution structural context.