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Electron Microscope Detectors

C71

Surface Concept provides retractable microchannel plate (MCP) based delay-line detectors for Transmission Electron Microscopes (TEMs). These detectors are sold as complete "plug and play" packages that mount to a standard camera port. They are designed for position and time-resolved detection of electrons, offering extremely high time resolution (sub-nanosecond). This capability makes them suitable for advanced research applications in electron imaging and time-of-flight measurements.

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