PHI nanoTOF 3
C17
PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability. The PHI nanoTOF 3 can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.
NEW Pulsed Dual-Beam Charge Neutralization For Truly Turn-Key Insulator Analysis
- Self-regulating charge neutralization by low energy electrons and low energy inert gas ions
- Artifact-free chemical imaging by neutralization of the position-dependent surface charges
NEW Bi Cluster Emitter With Smaller Beam Diameter For Improved High-Throughput HR2 Imaging
- The most utilitarian analysis mode with < 500 nm chemical characterization
- The HR2 imaging is attained at high analysis beam current so the analysis time is short
- Delayed extraction (DE) is not necessary, so the artifacts of DE are completely avoided
Confident Chemical & Molecular Analysis Of Curved, Rough & Charging Samples
- Superior angular acceptance and depth-of-field of the mass spectrometer
- Artifact-free chemical imaging of ex situ and in situ FIB-sectioned samples
- Superior imaging of materials by correcting the position-dependent surface potential
- Delayed extraction (DE) is not necessary, so the artifacts of DE are completely avoided
NEW Automated Stage & In-Vacuum Parking for High-Throughput Sample Handling & Unattended Analysis
- Equipped with an automatic sample transfer mechanism that has been proven in more than 300 Q-series XPS instruments
- Sample sizes up to 100 mm x 100 mm, and the analysis chamber has a built-in parking mechanism as standard
- Combined with the Queue Editor, the system allows continuous automated measurements of large numbers of samples
Tandem Mass Spectrometers For Rapid Imaging And Accurate Peak Identification
- No data is ever discarded; integrated and uncomplicated TOF-SIMS (MS1) and tandem MS (MS2) imaging
- Ultra-high transmission for optimized molecular sensitivity and monolayer analysis
- High speed (> 8 kHz) TOF-SIMS (MS1) and tandem MS (MS2) imaging
- High resolution (< 50 nm) TOF-SIMS (MS1) and tandem MS (MS2) imaging
- High energy (> 1.5 keV) collision-induced dissociation (keV-CID) for identification
Solutions For In Situ Characterization Of Advanced Materials
- All operation modes available for automated and unattended analysis
- Cryo- and high-temperature analysis via the Hot/Cold and High-Temperature module options; full 5-axis sample motion is maintained during temperature-controlled analysis
- Advanced 3D imaging with use of optional Ar, O2, Cs, C60, Ar cluster, and Ga-FIB ion beams
- Solid-state electrochemistry (biasing, polarization) experiments with the Static Voltage & Power Cycling option
- Inert Sample Transfer Vessel and Transfer Vessel Adapter (25 mm AES/XPS puck) options