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Vista 300

Molecular Vista

Scanning Probe Microscopy (SPM)

Product Overview

The Vista 300 is a highly advanced nano-chemical metrology instrument designed for research & development and failure analysis in nanofabrication. It is based on Photo-induced Force Microscopy (PiFM) and PiF-IR spectroscopy. This instrument combines Atomic Force Microscopy (AFM) functionality with chemical identification capabilities at the nanoscale. Key features and functionalities include: - Imaging Modes: Non-contact AFM, PiFM, KPFM (Kelvin Probe Force Microscopy), cAFM, nano DMA (Dynamic Mechanical Analysis), and Force vs. Distance (FvD) mapping. - Spectroscopy Modes: PiF-IR (Photo-induced Force Infrared Spectroscopy) and FvD. - Automation: Features like AutoPiFM and automatic alignment simplify data generation and operation. - Sample Size: It supports a large sample stage travel of 300 mm x 300 mm.
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Product Description

The Vista 300 is a highly advanced nano-chemical metrology instrument designed for research & development and failure analysis in nanofabrication. It is based on Photo-induced Force Microscopy (PiFM) and PiF-IR spectroscopy.

This instrument combines Atomic Force Microscopy (AFM) functionality with chemical identification capabilities at the nanoscale. Key features and functionalities include:

- Imaging Modes: Non-contact AFM, PiFM, KPFM (Kelvin Probe Force Microscopy), cAFM, nano DMA (Dynamic Mechanical Analysis), and Force vs. Distance (FvD) mapping.

- Spectroscopy Modes: PiF-IR (Photo-induced Force Infrared Spectroscopy) and FvD.

- Automation: Features like AutoPiFM and automatic alignment simplify data generation and operation.

- Sample Size: It supports a large sample stage travel of 300 mm x 300 mm.

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Molecular Vista

Molecular Vista is a US-based company that has commercialized Photo-induced Force Microscopy (PiFM). This advanced technique combines atomic force microscopy (AFM) with infrared spectroscopy to provide simultaneous topographical and chemical information at the 10-nm scale, enabling powerful nanoscale material characterization.

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