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Minus K Technology

United States

NW Verified

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About

Minus K is a leading US-based manufacturer of high-performance, passive vibration isolation systems. Their patented negative-stiffness technology provides industry-leading low-frequency vibration control, which is essential for the optimal performance of sensitive instruments like AFMs, electron microscopes, and micro-hardness testers.

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New CT-2 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform

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FEATURED PRODUCT

Company information

Founded

1993

Number of employees

1-10

Specialties

Cleanroom & Environmental Control

Products & Services

New CT-2 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform

The Minus K CT-2 is an ultra-thin, low-profile, passive vibration isolation platform. It employs Minus K's patented Negative-Stiffness mechanical technology to isolate sensitive equipment from low-frequency vibrations without the need for air or electricity. This compact design is engineered to support a wide range of payloads while providing significant vibration damping. The CT-2 is specifically designed to create a stable environment for high-resolution instruments that are susceptible to environmental vibrations, such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), profilometers, and other sensitive metrology tools used in nanotechnology and materials science.
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New CT-10 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform

The Minus K CT-10 is a passive, ultra-thin, low-height vibration isolation platform. It utilizes the company's patented Negative-Stiffness technology to provide a compact solution for isolating sensitive instruments from environmental vibrations. The platform is designed to support heavy payloads while maintaining a very low profile. It is a mechanical, passive system, meaning it does not require air or electricity to function. The primary application of the CT-10 is to provide a stable working surface for vibration-sensitive equipment such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), and other nanoscale metrology and imaging instruments.
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