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Minus K Technology
United States
NW Verified
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About
Minus K is a leading US-based manufacturer of high-performance, passive vibration isolation systems. Their patented negative-stiffness technology provides industry-leading low-frequency vibration control, which is essential for the optimal performance of sensitive instruments like AFMs, electron microscopes, and micro-hardness testers.
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New CT-2 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform
FEATURED PRODUCT
Company information
Founded
1993
Number of employees
1-10
Specialties
Cleanroom & Environmental Control
Products & Services
New CT-2 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform
The Minus K CT-2 is an ultra-thin, low-profile, passive vibration isolation platform. It employs Minus K's patented Negative-Stiffness mechanical technology to isolate sensitive equipment from low-frequency vibrations without the need for air or electricity. This compact design is engineered to support a wide range of payloads while providing significant vibration damping. The CT-2 is specifically designed to create a stable environment for high-resolution instruments that are susceptible to environmental vibrations, such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), profilometers, and other sensitive metrology tools used in nanotechnology and materials science.
New CT-10 Ultra-Thin Low-Height Tabletop Vibration Isolation Platform
The Minus K CT-10 is a passive, ultra-thin, low-height vibration isolation platform. It utilizes the company's patented Negative-Stiffness technology to provide a compact solution for isolating sensitive instruments from environmental vibrations. The platform is designed to support heavy payloads while maintaining a very low profile. It is a mechanical, passive system, meaning it does not require air or electricity to function. The primary application of the CT-10 is to provide a stable working surface for vibration-sensitive equipment such as atomic force microscopes (AFMs), scanning probe microscopes (SPMs), and other nanoscale metrology and imaging instruments.
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