Applied Nanotools Inc.

Fresnel zone plates are diffractive optics used for focusing extreme ultraviolet (EUV) and X-ray radiation. These components are fabricated with outer zone width resolutions as fine as 18 nm for soft X-rays and 30 nm for hard X-rays. They are critical components in synchrotron-based microscopy techniques such as STXM (Scanning Transmission X-ray Microscopy) and TXM (Transmission X-ray Microscopy), as well as in ptychography and phase contrast imaging. Custom options are available, including different materials (Au, Cu, Ni, W, Pt), the addition of central stops to block zero-order diffraction, and custom frame sizes.

Custom diffraction gratings and calibration standards are fabricated using high-resolution electron beam lithography (EBL). These gratings feature structures at the nanometer scale, including 1D gratings with a 278 nm pitch (3600 lines/mm) and 2D gratings with a 463 nm pitch. The components are designed for calibrating high-magnification imaging systems like Atomic Force Microscopes (AFMs) and Scanning Electron Microscopes (SEMs), and for use in spectroscopy and other nanophotonics applications. They are available on various substrates, including silicon and fused silica.