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JEOL Ltd.

Japan

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About

JEOL Ltd. is a leading global manufacturer of a wide range of scientific and metrology instruments. The company is a foundational provider of tools for nanotechnology, including a comprehensive portfolio of high-end Scanning Electron Microscopes (SEMs), Transmission Electron Microscopes (TEMs), and electron beam lithography systems.

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Company information

Founded

1949

Number of employees

1001-5000

Specialties

Electron & Ion Microscopy

Products & Services

CRYO ARM™ 200

Cryo-electron microscopy (cryo-EM) has taken enormous flight in recent years. Atomic level structural analysis of viruses and proteins derived by cryo-EM using SPA workflows requires high stability hardware and software. JEOL proudly announces its latest offering in cryo-TEMs to facilitate this development in cryo-EM with the CRYO ARM™ 200. The CRYO ARM™ 200 achieves unprecedented resolution and stability thus allowing for the automatic and unattended acquisition of image data for Single Particle Analysis. Automated specimen exchange system The system is composed of an autoloading specimen stage cooled to liquid nitrogen temperatures and a cryo-storage device for long-term storage of up to 12 frozen-hydrated specimens. Liquid nitrogen is automatically supplied to both the stage and storage system as required. The autoloader allows loading of retrieval of up to 4 grids at a time without impacting the remaining samples in the cryo-storage device. Specimens are stored and labeled using a unique system fully transparent to the operator. These unique capabilities enable beamline-like scheduling of microscopy. Cold field emission gun (Cold FEG) The cold FEG produces a high-brightness electron beam with a very small energy spread, thus offering high temporal coherency. In addition, spatial coherence is improved resulting in the CRYO ARM™ 200 achieving superior resolution and contrast compared any 200 kV cryo-TEM currently on the market. In-column energy filter (Omega filter) Equipped with an improved in-column energy filter (Omega filter), the CRYO ARM™ 200 acquires energy filtered images and energy loss spectra. Zero-loss imaging with the CRYO ARM™ 200 yields data with higher contrast due to reduced chromatic aberration. Automated image acquisition software for Single Particle Analysis The CRYO ARM™ 200 incorporates automated software for Single Particle Analysis (SPA) workflows called JADAS. This software allows for automated detection of holes on the specimen grid for automated, unattended acquisition of high-resolution images. Additionally, the CRYO ARM™ 200 is fully compatible with SerialEM (UC Boulder). Hole-free phase plate *1 The hole-free phase plate (HFPP) consist of a thin, continuous carbon film placed in the back focal plane of the objective lens, thus providing a substantial improvement in image contrast of frozen-hydrated specimen. Manufacturing of the HFPP uses a unique methodology resulting in robust and reliable performance at reasonable prices. Auto adjustment functions *2 Auto focus, auto coma-free alignment, auto parallel-beam illumination and other automated adjustments are available, enabling image acquisition under optimum conditions. *1: Optional unit. *2: Images acquired with the bottom mount camera are used.
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JEM-2100 Plus

The JEM-2100 Plus is a multipurpose 200kV LaB6 TEM that provides solutions for a wide range of applications from materials science to medical/biological studies, all at a low cost of ownership. Achieving superior performance through intuitive operation, the JEM-2100Plus advanced control system allows integration of STEM, EDS, and EELS as well as remote operation. For ease of use, the “TEM Center” software displays column controls, STEM operation, and camera operation compactly in a single screen. Operation is intuitive and uncomplicated. The operator can easily select a wide range of illumination modes at the touch of a button. To acquire images and diffraction patterns there is an optional JEOL-made bottom-mount camera called the “Matataki Flash” camera with a cutting-edge sCMOS sensor. The JEM-2100Plus features a high-stability goniometer stage specifically tuned for high tilt tomographic applications. An x/y piezo stage is an available option. The JEM-2100Plus has three independent condenser lenses, optimizing probe conditions for any given probe size for a variety of application such as EDX or NBD. This allows for improved analytical and diffraction capabilities giving quality results quickly and effortlessly. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination. The standard incorporation of the objective mini lens means that Lorentz microscopy is a standard feature of this microscope. A high contrast aperture is available for any choice of polepiece, allowing high contrast imaging and simultaneous EDS. The JEM-2100Plus offers a number of pumping options including full dry-pumped/turbo-pumped versions for lab environments that do not allow for oil-based or rotary pumps.
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JEM-120i

Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. We developed the JEM-120i with the concept of "Compact", "Easy To Use", and "Expandable". With the new external appearance, this instrument has evolved into a useful tool that anyone can use easily, from operation to maintenance.
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