Physical Electronics, Inc. (PHI)

PHI’s patented Parallel Imaging MS/MS mass spectrometer provides superior sensitivity, low spectral background, unique ability to image highly topographic surfaces, high mass accuracy and mass resolution, and unambiguous peak identification with parallel tandem MS imaging capability. The PHI nanoTOF 3 can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. NEW Pulsed Dual-Beam Charge Neutralization For Truly Turn-Key Insulator Analysis - Self-regulating charge neutralization by low energy electrons and low energy inert gas ions - Artifact-free chemical imaging by neutralization of the position-dependent surface charges NEW Bi Cluster Emitter With Smaller Beam Diameter For Improved High-Throughput HR2 Imaging - The most utilitarian analysis mode with 8 kHz) TOF-SIMS (MS1) and tandem MS (MS2) imaging - High resolution ( 1.5 keV) collision-induced dissociation (keV-CID) for identification Solutions For In Situ Characterization Of Advanced Materials - All operation modes available for automated and unattended analysis - Cryo- and high-temperature analysis via the Hot/Cold and High-Temperature module options; full 5-axis sample motion is maintained during temperature-controlled analysis - Advanced 3D imaging with use of optional Ar, O2, Cs, C60, Ar cluster, and Ga-FIB ion beams - Solid-state electrochemistry (biasing, polarization) experiments with the Static Voltage & Power Cycling option - Inert Sample Transfer Vessel and Transfer Vessel Adapter (25 mm AES/XPS puck) options