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Park Systems and imec sign the 2nd JDP to increase the strategic investment in developing Nano-Metrology Solutions for Semiconductor Manufacturing

March 09 2020

Park Systems, the global leader and innovator of Atomic Force Microscopy and Metrology solutions, and imec, world-leading R&D and innovation hub in nanoelectronics and digital technologies, have signed the 2nd Joint Development Project (JDP) within 4 years to increase the development efforts for future generation in-line AFM metrology solutions. The official signing ceremony has taken place February 17, 2020, at imec's headquarters in Leuven, Belgium.


The Art of Capturing Beauty at the Nanoscale

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