By Vmicro
Features - 10° TiltCompensated platform cantilever - 20x20µm Flat end parallel to the sample - 20µm long shaft Applications - Microsphere gluing - Uniform, angle-compensated contact for pressure-controlled measurements - Cell attachment Specifications - Frequency: 180.0 kHz (Nominal), Range 100-300 - Spring constant: 40.0 N/m (Nominal), Range 20-60 - Tip height H t: 20.0 µm (Nominal), Range nan - Tip apex radius: — nm (Nominal), Range +/-5% - Tip side angle θ: 180.0 ° (Nominal), Range +/-0.5° - Tip-cantilever angle α: 101.0 ° (Nominal), Range +/-0.5° - Cantilever length L c: 150.0 µm (Nominal), Range +/-1 - Cantilever width W c: 20.0 µm (Nominal), Range +/-1 - Cantilever thickness T c: 5.4 µm (Nominal), Range +/-0.15 - Cantilever backside coating: Uncoated - Tip-side coating: Uncoated - Tip and cantilever material: p-doped Silicon 0.01-0.02 ohm-cm - Chip dimensions: 3.4x1.6x0.4 mm
Features - New MEMS technology unlocking probe engineering - Long tip with profiled shape - small cone angle - TrueTipView: Precise tip visibility thus accurate landing on sample - Vertical sidewalls probe chip for easy handling Applications - Topography imaging in oscillating modes - Tapping mode - Non-contact mode - True non-contact TM - Roughness measurements - Nanoscale imaging on highly corrugated samples - Challenging aspect ratios Specifications Specifications Tilted tip design: Compensates for the AFM head mounting angle, ensuring accurate data on diverse sample surfaces. Tip height 30 µm: Enables imaging of deeper or difficult-to-access sample regions. Half-cone angle <10°: Minimizes tip-sample convolution, ensuring more accurate morphological measurements. Guaranteed tip radius <10 nm: Provides reliable resolution for advanced AFM applications.
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LS0P1Si-Si30, Lprobe life sciences, AFM probe (coating Si/Si, tip 30 µm, Vmicro) Features - Long tip suited to cell imaging - New MEMS technology unlocking probe engineering - Cone angle and tip-cantilever angle unlocked and chosen by design - Symmetrical tip in 10° probe holders - Negligible squeeze film damping in water: No frequency and Q reduction close to surface Applications - Imaging of cells, bacteria, and tissues in liquid or air - PeakForce Tapping TM mode - ScanAsyst TM mode - High-resolution imaging of polymers and composite materials Specifications - Frequency: kHz, Nominal 40.0, Range 20-100 - Spring constant: N/m, Nominal 0.1, Range 0.05-0.5 - Tip height H t: µm, Nominal 30.0, Range 15-50 - Tip apex radius: nm, Nominal 7.0, Range 2-10 - Tip side angle θ: °, Nominal 22.0, +/-0.5° - Tip-cantilever angle α: °, Nominal 112.0, +/-0.5° - Cantilever length L c: µm, Nominal 80.0, +/-1 - Cantilever width W c: µm, Nominal 20.0, +/-1 - Cantilever thickness T c: µm, Nominal 0.5, +/-0.15 - Cantilever backside coating: Uncoated - Tip-side coating: Uncoated - Tip and cantilever material: p-doped Silicon 0.01-0.02 ohm-cm - Chip dimensions: mm, 3.4x1.6x0.4
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Lprobe conductive, AFM probe (coating Pt/Pt, tip 30 µm, Vmicro) Features: - New MEMS technology unlocking probe engineering - Long tip reduces cantilever artifacts in electrical modes - Cone angle and tip-cantilever angle unlocked and chosen by design - TrueTipView: Precise tip visibility enables accurate landing on sample - Vertical sidewalls probe chip for easy handling Applications: - Electrical modes - Electrostatic Force Microscopy (EFM) - Kelvin Probe Force Microscopy (KPFM) Specifications: - Frequency: 250.0 kHz (nominal), 150-300 (range) - Spring constant: 20.0 N/m (nominal), 8-30 (range) - Tip height H t: 30.0 µm (nominal), 15-50 (range) - Tip apex radius: 25.0 nm (nominal), 20-35 (range) - Tip side angle θ: 15.0° (nominal), +/-0.5° (range) - Tip-cantilever angle α: 118.0° (nominal), +/-0.5° (range) - Cantilever length L c: 115.0 µm (nominal), +/-1 (range) - Cantilever width W c: 40.0 µm (nominal), +/-1 (range) - Cantilever thickness T c: 2.8 µm (nominal), +/-0.15 (range) - Cantilever backside coating: Pt - Tip-side coating: Pt - Tip and cantilever material: p-doped Silicon 0.01-0.02 ohm-cm - Chip dimensions: 3.4x1.6x0.4 mm
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LT020Al-Si30, Lprobe tapping, AFM probe (coating Al/Si, tip 30 µm, Vmicro) Features - New MEMS technology unlocking probe engineering - Long tip with profiled shape - small cone angle - TrueTipView: Precise tip visibility thus accurate landing on sample - Vertical sidewalls probe chip for easy handling Applications - Topography imaging in oscillating modes - Tapping mode - Non-contact mode - True non-contact TM - Olympus AC160 ideal replacement - Roughness measurements - Nanoscale imaging on highly corrugated samples - Challenging aspect ratios Specifications Parameter | Unit | Nominal | Range Frequency | kHz | 250.0 | 150-300 Spring constant | N/m | 20.0 | 8-30 Tip height H t | µm | 30.0 | 15-50 Tip apex radius | nm | 7.0 | 2-10 Tip side angle θ | ° | 15.0 | +/-0.5° Tip-cantilever angle α | ° | 118.0 | +/-0.5° Cantilever length L c | µm | 115.0 | +/-1 Cantilever width W c | µm | 40.0 | +/-1 Cantilever thickness T c | µm | 2.8 | +/-0.15 Cantilever backside coating | Al Tip-side coating | Uncoated Tip and cantilever material | p-doped Silicon 0.01-0.02 ohm-cm Chip dimensions | mm | 3.4x1.6x0.4 Cantilever & tip details
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