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EnviroMETROS XPS/HAXPES System
MetrologyInstrumentation

EnviroMETROS XPS/HAXPES System

By LAB14

The EnviroMETROS system by SPECSGROUP will expand MIT.nano’s Characterization.nano instrument suite. Its functions include: - nondestructive depth profiling using multiple X-ray energies - determination of thin-film thicknesses and chemical compositions with high precision - analysis under a wide pressure range to assess material behavior in realistic environments These capabilities support research involving thin-film materials, surface chemistry, and in-operando studies.

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