SEM Mill A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality scanning electron microscopy samples in the shortest amount of time for a wide variety of applications. Ideal for both planar sample delayering and cross-section sample polishing. Ion milling is used in the physical sciences to enhance the sample’s surface characteristics. Inert gas, typically argon, is ionized and then accelerated toward the sample surface. By means of momentum transfer, the impinging ions sputter material from the sample at a controlled rate. For many of today’s advanced materials, analysis by scanning electron microscopy is an ideal technique for rapidly studying material structure and properties. The SEM Mill is an excellent tool for creating the sample surface characteristics needed for SEM imaging and analysis. - Two independently adjustable TrueFocus ion sources - High energy operation for rapid milling; low energy operation for sample polishing - Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV) - Faraday cups for the direct measurement of beam current from each ion source - Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters - Create pristine cross-section samples with the Cross-section station (optional) - Independent ion source gas control - Adjustable milling angle range of 0 to +10° - In situ viewing and image capture during milling - Sample rocking or rotation with ion beam sequencing - Automatic termination by time or temperature - Liquid nitrogen-cooled sample stage (optional) - Vacuum or inert gas transfer capsule (optional)
Includes all the components required to produce high quality cross-section specimens for transmission electron microscopy. Widely used cross-section specimens include semiconductor devices (which often have multiple layers and, thus, multiple interfaces), specimens with thin film layers, and composite materials. For the study of interfaces by transmission electron microscopy, it is critical to align the interface of interest parallel to the incident electron beam. One method for preparing such samples is to fabricate cross-section specimens. - Stacks and holds cross-section specimens - Aligns areas and interface of interest - Produces consistent glue layer thickness - Resulting stacks are readily cut by the Model 170 Ultrasonic Disk Cutter - Fabricate self-supported 3 mm diameter disk specimens
CATEGORY
Specimen Grinder. Mechanically prethins specimens for transmission electron microscopy. Produces uniform thickness specimens with parallel sides. Greatly reduces the time spent during the final preparation process of ion beam milling. For transmission electron microscopy, the quality of the initial disk determines the quality of the final specimen. The disk can be mechanically ground using the Model 160 Specimen Grinder to a precisely controlled thickness. Use the Model 200 Dimpling Grinder for final thinning. - Accurate and dependable - Precisely controlled - Specimens up to 18 mm diameter - No additional force needed - Large diameter provides excellent stability - Platen transferable to the Model 200 Dimpling Grinder
CATEGORY
Ultra-Narrow Gap Tomography Holder. A holder capable of tilting up to 90° while providing a maximized field of view for transmission electron microscopy. The Model 2030 Ultra-Narrow Gap Tomography Holder is capable of tilting up to 90° while providing a maximized field of view. The holder is suitable for ultra-narrow gap (< 3 mm) pole-piece geometries. The Ultra-Narrow Gap Tomography Holder accepts a 1.5 mm square or round TEM specimen or grid into a cartridge, securing it with a single clamp. Items included are a specimen loading stand, a Model 9010 Vacuum Storage Container, a loading fixture, a clamp tightening tool, copper grids, tweezers, and a spare parts kit. The holder: - Specimen loading station allows easy positioning and clamping of the specimen into the cartridge - Has a streamlined specimen clamping mechanism eliminates the shadowing associated with most holders at high-tilt angles - Has a retractable clamp that evenly distributes force on the specimen - Accommodates specimen thicknesses up to 100 μm - Is compatible with the TEM’s touch alarm, which stops goniometer movement in the event that a pole touch occurs The holder is available for both JEOL and Thermo Fisher Scientific microscopes.
CATEGORY
Produces high quality disk specimens from thin metal foils. A precision ground punch and die plate eliminate specimen stress and distortion. An ideal accessory to the Model 110 Automatic Twin-Jet Electropolisher. The specimen punch is available with a standard base or with a wide base, which provides extra stability when producing thin foils. A precision ground punch and die plate eliminate specimen stress and distortion of the disk specimen. A spring-loaded return plunger keeps the disk specimen on the die plate surface for convenient handling. Available in standard sizes of 1 mm, 2.3 mm, and 3.0 mm; other sizes available upon request
CATEGORY
